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Influence of Manufacture Imperfections and Electrical Noise on Evolution of a Charge Qubit under Optical Control
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Influence of Manufacture Imperfections and Electrical Noise on Evolution of a Charge Qubit under Optical Control
Annotation
PII
S0544126924060022-1
Publication type
Article
Status
Published
Authors
A. V. Tsukanov 
Affiliation: NRC “Kurchatov Institute”
I. Yu. Kateev
Affiliation: NRC “Kurchatov Institute”
Edition
Volume 53 Issue number 6
Pages
469-482
Abstract
Semiconductor charge qubits based on a double quantum dot in an optical microcavity (a photonic crystal defect) are considered taking into account deviations of parameters from preset ones. Influence of topological disorder of a photonic crystal structure on microcavity spectrum and effect of a stochastic field of external charges on the qubit state are analyzed. Ways to attenuate these effects and to optimize the qubit state storage are indicated.
Keywords
квантовая точка зарядовый кубит фотонный кристалл топологический беспорядок электрический шум
Acknowledgment
The study was conducted within the state assignment of Kurchatov Institute, Ministry of Science and Higher Education of the Russian Federation, theme № FFNN-2022-0016, Fundamental and applied research in the field of development of methods for high-precision modeling and control of the element base of quantum computers”
Received
02.03.2025
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