RAS Nano & ITМикроэлектроника Russian Microelectronics

ISSN (Print) 0544-1269
ISSN (Online) 3034-5480

Archive / Issue 2024, Volume 53, №2

ДИАГНОСТИКА

Structural features and electrical properties of si(al) thermal migration channels for high-voltage photovoltaic converters

A. A. Lomov / B. M. Seredin / S. Yu. Martyushov / A. A. Tatarintsev / V. P. Popov / A. V. Malibashev

119-131

МОДЕЛИРОВАНИЕ

Modeling the diffusion of atoms in multicomponent semiconductors in a disordered state

S. M. Asadov

132-141

Application of the finite element method for calculating the surface acoustic wave parameters and devices

A. S. Koigerov

142-155

The new approach of a simulation low dose rate radiation effects in bipolar integrated circuits

A. I. Chumakov

156-161

ТЕХНОЛОГИИ

Ripple of a DC/DC converter based on SEPIC topology

V. K. Bityukov / A. I. Lavrenov

162-168

Influence of nickel impurities on the operational parameters of a silicon solar cell

Z. T. Kenzhaev / N. F. Zikrillaev / V. B. Odzhaev / K. A. Ismailov / V. S. Prosolovich / Kh. F. Zikrillaev / S. V. Koveshnikov

169-178

Temporary changes in current flow mechanisms in erbium-doped porous silicon

E. Kh. Khamzin / D. A. Uslin

179-186

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Индексирование

Scopus

Scopus — Crossref

Scopus — Higher Attestation Commission

At the Ministry of Education and Science of the Russian Federation

Scopus — Scientific Electronic Library