RAS Nano & ITМикроэлектроника Russian Microelectronics

  • ISSN (Print) 0544-1269
  • ISSN (Online) 3034-5480

Tomography of Detectors Taking Dead Time into Account

PII
10.31857/S0544126923700369-1
DOI
10.31857/S0544126923700369
Publication type
Status
Published
Authors
Volume/ Edition
Volume 52 / Issue number 4
Pages
249-255
Abstract
Using numerical simulation methods that take into account the dead time effect, algorithms are developed to calculate the detector’s response for photon fluxes with different photon number distributions, including the Poisson, Fock, and thermal distributions. Based on the results obtained, a detector tomography method is developed, as well as an algorithm for identifying the corresponding elements of a positive opera-tor-valued measure (POVM). Experimental studies using coherent states demonstrate close agreement between the calculation results and experimental data.
Keywords
<i>:</i> детекторы фотонов мертвое время детектора когерентные состояния, фоковские состояния, тепловые состояния
Date of publication
16.09.2025
Year of publication
2025
Number of purchasers
0
Views
14

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