RAS Nano & ITМикроэлектроника Russian Microelectronics

  • ISSN (Print) 0544-1269
  • ISSN (Online) 3034-5480

A. E. Rogozhin

Author ID
84693

By this author

  • Calculation of distributions of electron beam energy absorbed in PMMA and Si using various scattering models

  • ELECTRICAL CHARACTERISTICS OF RUTHENIUM LINES WITH A CROSS-SECTIONAL AREA LESS THAN 1000 nm

  • FERROELECTRIC TRANSISTORS: OPERATING PRINCIPLES, MATERIALS, APPLICATIONS

  • Neuromorphic Systems: Devices, Architecture, and Algorithms

  • Calculation of distributions of electron beam energy absorbed in PMMA and Si using various scattering models

  • ELECTRICAL CHARACTERISTICS OF RUTHENIUM LINES WITH A CROSS-SECTIONAL AREA LESS THAN 1000 nm

  • FERROELECTRIC TRANSISTORS: OPERATING PRINCIPLES, MATERIALS, APPLICATIONS

Индексирование

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Higher Attestation Commission

At the Ministry of Education and Science of the Russian Federation

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Scientific Electronic Library